Department of Physics

The department offers the private sector services in particular in the fields of nondestructive testing, the development of diagnostic methods and designing reliability indicators for materials and electronic components.

During the realization phase our projects are supervised by a certified project manager according to the IPMA methodology; we have set up processes which guarantee the protection of industrial secrets.

We offer the following:

  • Nondestructive diagnostics of materials, in particular semiconductors and dielectrics
  • Complete solutions to diagnostics of solar cells and panels
  • Use of electromagnetic and acoustic emission methods for material diagnostics (composite materials, building materials, rocks, etc.)
  • Non-contact, nondestructive examination of material surfaces with transversal super-resolution
  • Analysis of local optical and electrical characteristics of opto-electrical and photonic structures
  • Determination of surface topology
  • Development X-radiation sensors based on CdTe and gas detectors
  • Comprehensive dielectric relaxation spectroscopy, monitoring molecular dynamics and dielectric materials using an ALFA analyser
  • Analysis and processing of signals
  • Laboratory hire, hire of instrumentation and measuring apparatuses – all world-class
  • Outsourcing specialists and whole teams
  • Consultancy and expert counselling, project management services

Special instrumentation:

  • Janis Research Helium closed cryogenic system, with temperature range of 10 K to 500 K
  • NT-MDT Solar scanning modular microscope for optical near field with replaceable AFM head
  • Nitrogen tunable laser for the field of 530 – 1050 nm
  • Special apparatus for measuring low frequency electronic noise with a Cascade Microtech M150 precise testing station, a Kheitley 4200 analyser with five independent SMU and a Agilent 4980A LCR meter
  • Agilent FFT dynamic spectral analyser in the basic band (DC - 100 kHz)
  • Rohde & Schwarz FSV signal and spectral analyser and Rohde & Schwarz FMU36 spectral analyser in the basic band
  • National Instruments continuous sampling equipment (sampling frequency 60 MHz)
  • Hamamatsu cooled detection unit with photomultiplier
  • CCD camera G2-3200 for measuring of radiation emitted by the measured samples
  • Computer-controlled hydraulic press up to 300 kN
  • Sample deformation meters


  • AVX Czech Republic, s. r. o., Lanškroun
  • AVX Czech Republic, s. r. o., Uherské Hradiště
  • KYOCERA Group Company
  • E S L, a.s.
  • Solartec, s. r. o.
  • Třinecké železárny, a. s.
  • Delong Instruments, a. s.
  • Netural Energy Engineering, s. r. o.
  • Icontio Ltd.


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